This approach greatly facilitates the use of a low cost and easily obtainable material like soda lime glass for the monitor while still permitting a precision thickness control of the respective layers with an optical monitoring method. Thus, a versatile anti-reflection coating design is provided that results in an easy to produce, highly durable anti-reflecting coating applicable to a significantly large number of glass substrates. Finally, it is considered desirable, for enhancing the optical characteristics, that MgF2, which has the greatest difference in refractive index from the monitored glass from the practical applicable materials available in anti-reflection coatings, be used for the fourth layer. Thus, optimum values are determined, for example, as follows, assuming that the first boundary is between air A and a first layer I, the second boundary between the first layer I and a second layer II, the third boundary between the second layer II and a third layer III, the fourth boundary between the third layer III and a fourth layer IV, and the fifth boundary between the fourth layer IV and the glass substrate B. Nowadays, polymer/silicon heterojunction solar cell with poly(3,4-ethylenedioxythiphene):poly (styrene sulfonate) (PEDOT:PSS) i.e. The thickness of PEDOT:PSS thin films deposited on c-Si was measured by Dektak-150 thickness profilometer and the reflectance of flat silicon and PEDOT:PSS on flat silicon was measured by Shimadzu UV–vis spectrophotometer (UV-2600 Shimadzu). Published by IOP Publishing Ltd As can be appreciated, the theoretical design is also applicable to a plastic substrate. While an improvement in the anti-reflectance characteristics of the coating is found, there are still a number of disadvantages in the structure disclosed in this patent. The invention of claim 5 wherein the third layer is selected from a group consisting of Al, 14. The optical thickness is the product of the refractive index times the physical thickness, Nd, as known in the art. A multi-layered anti-reflection coating as in claim 1 wherein the second and fourth layers are selected from a group consisting of ZrO, 4. However, since the optical thicknesses of the third layer III and fourth layer IV have not been determined, it is impossible to fully depict the vectors CD and DE. A five layer anti-reflection coating for a substrate utilizing respectively a low index, NL, and a high index, NH, material is provided. As is clear from FIG. Curve 10 in FIG. However, there are few reports on the use of low temperature solution-processed DARC structures for the PEDOT:PSS/c-Si heterojunction solar cells such as TiO2, MoOx and Nafion which include PEDOT:PSS as one of the DARC layers [10, 12, 21, 24]. Graduate School of Science and Engineering, Saitama University, Saitama 338-8570, Japan, Jaker Hossain https://orcid.org/0000-0001-7167-8634, Received 3 October 2019 The length of each vector is directly related to the absolute value of the Fresnel coefficient at each boundary, while the direction of each vector is determined by the value of Î² and by whether the Fresnel coefficient is positive or negative, i.e., the direction of the vector is determined by the phase angle related to Î²i measured in a counterclockwise direction when the Fresnel coefficient is positive, and measured in a clockwise direction when negative. The idea behind this method is to adjust the electric and magnetic field of the incident light on the surface of multilayer optical coatings . Another object is to maintain a sufficient anti-reflection effect for various glass substrates having a refractive index over a wide range with improved optical characteristics and durability. Multiple layers are more effective over the entire visible spectrum. 4 show the spectral reflectance characteristics for vertically incident light as set forth in embodiments 7, 8 and 9. FIG. Therefore, the deposition of multilayer antireflection coatings (MARCs) on solar cell with flat silicon substrate seems to be a good solution to further reduction of optical losses as well as avoiding defects for achieving higher photovoltaic performance of the solar cells. Frequently, the design wavelength will be 510 nanometers and is referred to herein as Î»o. The following specification, taken in conjunction with the drawings, sets forth the preferred embodiment of the present invention in such a manner that any person skilled in the optical field can use the invention. 2 can accordingly be drawn, in which the interaction between the light rays reflected on the respective boundaries for wavelength Î»o are represented by means of the complex amplitude and phase of the light rays. The most interesting feature of this ARCs layer design is that all of the ARC layers have small physical thicknesses. Screened for originality? U.S. Pat. On the other hand, ARCs for the PEDOT:PSS/c-Si heterojunction solar cells require low temperature deposition process because the processing temperature higher than 200 °C severely deteriorates the properties of PEDOT:PSS polymer and hence the performance of the solar cells . The design can be defined by the following parameters: wherein N refers to the refractive index, d refers to the physical thickness with their respective subnumbers referring to the layer, with the fourth layer being the layer closest to the substrate, and Î»o refers to a preselected design wavelength. The invention of claim 5 wherein the refractive indices are as follows: 17. The features of the present invention which are believed to be novel are set forth with particularity in the appended claims. Nos. 5 is a reflectance graph for the embodiments disclosed in Table III. Finally, the third layer is selected from a group comprising Al2 O3, CeF3, Y2 O3, Gd2 O3, and MgO. Multi-layer coatings can reduce the loss over the visible spectrum. Curves 2 and 3 in FIG. 5 indicates the spectral reflectance characteristics of embodiment 3. The present invention relates to a multi-layer anti-reflection coating to be applied to a substrate and more particularly, to an anti-reflection coating design that is particularly susceptible to production line manufacturing. The colors used are to distinguish the layers, but not otherwise significant. The invention of claim 5, wherein the second and fourth layers are selected from a group consisting of ZrO, 13. The invention of claim 19 wherein the relationship between the indices of refraction are as follows: 21. 3a and 3b show the percent of reflectance versus wavelength curves for embodiments 1-6 listed in Table 1, the curves being plotted for vertically incident light. (a) The schematic diagram of the single layer ARC design and (b) The measured reflectance spectra of flat Si and 80 nm thick PEDOT:PSS thin film on flat Si. 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